Enlumen is equipped with high-precision angle measurement instruments, with an angle measurement accuracy of ±1" and a resolution of 0.1", supporting the measurement of angular deviations of optical components. Laser interferometer: Surface shape measurement accuracy up to λ/20 (λ=633nm), film thickness measurement resolution of 1nm, supporting surface shape error analysis of flat, spherical, and aspherical surfaces (such as PV value, RMS value). Japanese Shimadzu UV3600 spectrophotometer: Measurement range: 190nm~3300nm, wavelength accuracy ±0.1nm, photometric accuracy ±0.05% T, capable of full-spectrum analysis of transmittance, reflectance, and absorptance.